2024 Impact factor 1.5
Atomic, Molecular, Optical and Plasma Physics

EPJ E Colloquium: Adhesion induced pattern formation in constrained soft films

Formation of an interfacial pattern between a thin film of soft gel and a rigid glass plate that also shows the motion of bubbles.
© Chaudhury et al.

A hydrostatically-stressed soft elastic film responds by developing a morphological instability, the wavelength of which is dictated by minimisation of the surface and elastic strain energies of the film. For a single film, the wavelength of this transition is entirely dependent on the film's thickness, however in the case of two contacting films a co-operative energy minimisation dictates that the wavelength depends on both the elastic moduli and the thicknesses of the two films.

In addition, the wavelength can depend on the material properties of the film if its surface tension has a pronounced effect when compared to its elasticity. When such a confined film is subjected to a continually-increasing normal displacement, the morphological patterns evolve into cracks which, in turn, govern the adhesive fracture behaviour of the interface. While, in general, the film thickness provides the relevant length scale underlying the well-known Griffith-Kendall criterion of debonding of a rigid disc from a confined film, it is modified non-trivially by the elasto-capillary number for an ultra-soft film.

Depending on the degree of confinement and the spatial distribution of the external stress, various analogues of the canonical instability patterns found in liquid systems can be reproduced in confined thin elastic films.

Editors-in-Chief
A. Beige, H. Kersten and P. Limao Vieira
It was my pleasure to be given the opportunity of being helpful in the scientific production process of EPJD. I enjoyed the experience as a referee for the journal: it was instructive, and its procedures were clear and simple. You can certainly count on my assistance for future similar appointments.

Luca Argenti

ISSN (Print Edition): 1434-6060
ISSN (Electronic Edition): 1434-6079

© EDP Sciences, Società Italiana di Fisica and Springer-Verlag