2024 Impact factor 1.5
Atomic, Molecular, Optical and Plasma Physics

Editorial Board

Editors-in-Chief

Almut Beige, University of Leeds, Leeds, United Kingdom

Holger Kersten, Kiel University, Kiel, Germany

Paolo Limao Vieira, Universidad de Nova de Lisboa, Faculdade de Ciências e Tecnologia, Portugal

Editorial Board

Robert Bennett, University of Glasgow, Glasgow, United Kingdom

David B. Cassidy, University College London, London, United Kingdom

Wonho Choe, Korea Advanced Institute of Science and Technology, Daejeon, South Korea

Ivo Pietro Degiovanni, Istituto Nazionale di Ricerca Metrologica, Turin, Italy

Filipe Ferreira da Silva, Universidade Nova de Lisboa, Lisbon, Portugal

Kun Huang, East China Normal University, Shanghai, China

Darryl Jones, Flinders University, Adelaide, Australia

Joan P. Marler, Clemson University, Clemson, SC, United States of America

Steen Brøndsted Nielsen, Aarhus University, Aarhus, Denmark

Stefano Olivares, University of Milan, Milan, Italy

Lawrence J. Overzet, The University of Texas at Dallas, Richardson, TX, United States of America

Stefan Schippers, University of Giessen, Giessen, Germany

Thomas Schlathölter, University of Groningen, Groningen, The Netherlands

Vladimir Shabaev, St. Petersburg University, Saint Petersburg, Russia

Thomas Stöhlker, Helmholtz Institute, Jena, Germany

Eric Suraud, Université Toulouse III - Paul Sabatier, Toulouse, France

Kazuo Terashima, University of Tokyo, Tokyo, Japan

Xiao-Min Tong, University of Tsukuba, Tsukuba, Japan

Hugo Van Der Hart, Queen's University Belfast, Belfast, United Kingdom

Ron White, James Cook University, Townsville, Australia

Tongpu Yu, National University of Defense Technology, Changsha, China

Former Editors-in-Chief

Click here to see the list of former Editors-in-Chief.

Editors-in-Chief
A. Beige, H. Kersten and P. Limao Vieira
It has been a pleasure for me accepting the referee's commitment for your journal and I am hopeful to collaborate with you again in the future.

Simone Panaro

ISSN (Print Edition): 1434-6060
ISSN (Electronic Edition): 1434-6079

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