Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip p. 173
Published online: 16 January 2009
DOI: 10.1140/epjd/e2009-00001-5
It was my pleasure to be given the opportunity of being helpful in the scientific production process of EPJD. I enjoyed the experience as a referee for the journal: it was instructive, and its procedures were clear and simple. You can certainly count on my assistance for future similar appointments.