https://doi.org/10.1140/epjd/e2003-00139-0
Buffer effects of titanium in the case of silver/α - Al2O3(0001)
1
Laboratoire
CNRS-Saint Gobain, “Surface du verre et Interfaces", 93303
Aubervilliers, France
2
Groupe Physique des Solides, Place
Jussieu, 75251 Paris Cedex 05, France
Corresponding author: a elin.sondergard@saint-gobain.com
Received:
10
September
2002
Published online:
3
July
2003
The influence of thin titanium layers on the growth of silver clusters on α - Al2O3(0001) is investigated. We demonstrate through in situ RHEED measurements that titanium can relax stress in a growth mode where two lattice parameters show up simultaneously. Above a certain thickness, the lattice parameter closest to the bulk value of titanium dominates. Depending on the amount of stress in the titanium layer, silver films can either develop 3D textures or grow in epitaxy and form 2D like films.
PACS: 61.14.Hg – Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED) / 68.35.-p – Solid surfaces and solid-solid interfaces: Structure and energetics / 68.47.Jn – Clusters on oxide surfaces
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2003
