https://doi.org/10.1140/epjd/e2009-00002-4
“Electron impact ionization of helium isoelectronic systems"
M.R. Talukder, Eur. Phys. J. D 49, 167–172 (2008)
1
Faculty of Physics, Weizmann Institute of Sciences, Rehovot, 76100, Israel
2
National Institute of Standards and Technology, Gaithersburg, MD, 20899-8422, USA
Corresponding author: a yuri.ralchenko@nist.gov
Received:
5
October
2008
Published online:
6
February
2009
We show that the criticism [Eur. Phys. J. D 49, 167 (2008)] of our empirical formula for electron-impact ionization of atomic ions [J. Phys B. 33, 5025 (2000)] is unjustified.
PACS: 34.80.Dp – Atomic excitation and ionization
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2009