Eur. Phys. J. D 49, 167-172 (2008)
https://doi.org/10.1140/epjd/e2008-00145-8

Electron impact ionization of helium isoelectronic systems

Department of Applied Physics & Electronic Engineering University of Rajshahi, Rajshahi-6205, Bangladesh

Corresponding author: ^a mrtalukder@ru.ac.bd

Received: 20 April 2008
Revised: 8 June 2008
Published online: 30 July 2008

Abstract

The electron impact single ionization cross sections, on the helium isoelectronic He, Li¹⁺, B³⁺, C⁴⁺, N⁵⁺, O⁶⁺, Ne⁸⁺, Na⁹⁺, Ar⁺¹⁶, Fe²⁴⁺, Mo⁴¹⁺, Ag⁴⁵⁺, and U⁹⁰⁺ targets, are calculated modifying the simplified Bell (SBELL) model [Eur. Phys. J. D 46, 281 (2008)]. The results of the present analysis are compared with the available experimental and theoretical data. The modified SBELL (MSBELL) model, incorporating the ionic correction factor in it, produces excellent agreement with the experimental data and theoretical calculations for all the two-electron systems, neutral or ions. This model may be a prudent choice in plasma modeling due to its simple inherent structure.