Electron impact ionization of helium isoelectronic systems
Department of Applied Physics & Electronic Engineering University of Rajshahi, Rajshahi-6205, Bangladesh
Corresponding author: a firstname.lastname@example.org
Revised: 8 June 2008
Published online: 30 July 2008
The electron impact single ionization cross sections, on the helium isoelectronic He, Li1+, B3+, C4+, N5+, O6+, Ne8+, Na9+, Ar+16, Fe24+, Mo41+, Ag45+, and U90+ targets, are calculated modifying the simplified Bell (SBELL) model [Eur. Phys. J. D 46, 281 (2008)]. The results of the present analysis are compared with the available experimental and theoretical data. The modified SBELL (MSBELL) model, incorporating the ionic correction factor in it, produces excellent agreement with the experimental data and theoretical calculations for all the two-electron systems, neutral or ions. This model may be a prudent choice in plasma modeling due to its simple inherent structure.
PACS: 34.80.Dp – Atomic excitation and ionization by electron impact
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2008