https://doi.org/10.1140/epjd/e2002-00140-1
Low energy electron attachment to formic acid
1
Institut für Ionenphysik der Leopold Franzens Universität, Technikerstrasse 25, 6020 Innsbruck, Austria
2
Department of Physics and Astronomy, University College London, Gower Street, London WC1E 6BT, UK
3
Department of Plasmaphysics, Comenius University, 84248 Bratislava, Slovak Republic
Corresponding author: a tilmann.maerk@uibk.ac.at
Received:
23
January
2002
Revised:
9
February
2002
Published online:
13
September
2002
Using a high resolution electron energy monochromator low energy electron
attachment to formic acid is studied for the first time by means of mass spectrometric
detection of the product anions. The largest dissociative electron attachment (DA) cross-section produces 
with weaker channels for OH- and O- becoming apparent at
higher incident energies.
PACS: 34.80.Ht – Dissociation and dissociative attachment by electron impact / 87.50.Gi – Ionizing radiations (ultraviolet, X-rays, γ-rays, ions, electrons, positrons, neutrons, and mesons, etc.) / 82.80.Ms – Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2002
