https://doi.org/10.1007/s100530070038
A coincidence technique for the study of intense laser atom interactions
1
Foundation for Research and Technology - Hellas, Institute of Electronic Structure and Laser,
Laser and Applications Division, P.O. Box 1527, 71110 Heraklion, Crete, Greece
2
Department of Physics, University of Crete, P.O. Box 2208, 71003 Heraklion, Crete, Greece
Received:
22
November
1999
Published online: 15 October 2000
A new device for charged particle coincidence experiments in strong-field, short pulse
laser-atom/molecule interactions is presented. The device consists of a single time of
flight spectrometer, common for both positive and negative charge detection.
Experimental parameters required for the use of the device in the high intensity
regime are discussed. A demonstration of electron-ion coincidence measurements in
the interaction of Xe atoms with 60 fs laser pulses at 800 nm and an intensity of
W/cm2 is reported.
PACS: 32.80.Gc – Photodetachment of atomic negative ions / 32.80.Rm – Multiphoton ionization and excitation to highly excited states (e.g., Rydberg states) / 39.30.+w – Spectroscopic techniques
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2000
