The reflectivity of relativistic ultra-thin electron layers
Max-Planck-Institut für Quantenoptik, 85748 Garching, Germany
Revised: 28 January 2009
Published online: 19 March 2009
The coherent reflectivity of a dense, relativistic, ultra-thin electron layer is derived analytically for an obliquely incident probe beam. Results are obtained by two-fold Lorentz transformation. For the analytical treatment, a plane uniform electron layer is considered. All electrons move with uniform velocity under an angle to the normal direction of the plane; such electron motion corresponds to laser acceleration by direct action of the laser fields, as it is described in a companion paper [Eur. Phys. J. D 55, 433 (2009)]. Electron density is chosen high enough to ensure that many electrons reside in a volume λR3, where λR is the wavelength of the reflected light in the rest frame of the layer. Under these conditions, the probe light is back-scattered coherently and is directed close to the layer normal rather than the direction of electron velocity. An important consequence is that the Doppler shift is governed by γx=(1-(Vx/c)2)-1/2 derived from the electron velocity component Vx in normal direction rather than the full γ-factor of the layer electrons.
PACS: 52.38.Ph – X-ray, gamma-ray, and particle generation / 52.59.Ye – Plasma devices for generation of coherent radiation
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2009