https://doi.org/10.1140/epjd/e2007-00325-0
Absolute frequency measurements of wavelength standards 532 nm, 543 nm, 633 nm and 1540 nm
Czech Metrology Institute, Laboratories of fundamental metrology, V Botanice 4, 150 72 Praha 5, Czech Republic
Corresponding author: a pballing@cmi.cz
Received:
15
July
2007
Revised:
12
November
2007
Published online:
5
December
2007
This paper describes the results of absolute frequency measurements of primary wavelength standards 633 nm, 543 nm, 532 nm, (iodine stabilized) and 1540 nm (acetylene stabilized) in CMI. The values obtained with Menlo Systems femtosecond frequency comb in CMI are compared with previous measurements of the same standards in BIPM, BEV and MPQ. Measured sub-Doppler linewidths and relative intensities of several hyperfine spectral components of iodine molecule are also presented.
PACS: 42.62.Fi – Laser spectroscopy / 42.62.Eh – Metrological applications; optical frequency synthesizers for precision spectroscopy / 06.30.Ft – Time and frequency
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2008
