Eur. Phys. J. D 37, 305-311 (2006)
https://doi.org/10.1140/epjd/e2005-00273-7

Negligible carrier envelope phase dependence of total single and double ionization yields of xenon

Photonics Institute, Vienna University of Technology, Gusshausstr. 27/387, 1040 Wien, Austria

Corresponding author: ^a matthias.lezius@tuwien.ac.at

Received: 28 June 2005
Revised: 19 August 2005
Published online: 11 October 2005

Abstract

We investigate the carrier-envelope phase dependence of the total ionization yield for single and double ionization of xenon. We compare our results to theoretical calculations and to the phase dependent asymmetry in photoelectron emission. We observe that the phase dependence of the photoion yields, regardless if single or double ionization, is at least 2-3 orders of magnitude below the photoelectron emission signal. We conclude that total photoionization yields are only very weakly dependent on the carrier envelope phase, and that they are not a useful means for measurement of the phase. It seems possible that the broad bandwidth of few-cycle pulses facilitates multiphoton ionization, which leads to a randomization of strong field ionization phase dependencies. Besides, we observe that the spatial asymmetry in photoelectron emission appears to be useful as an indicator for the laser pulse duration in the few cycle regime.