https://doi.org/10.1140/epjd/e2005-00207-5
Low energy electron attachment to C60
Tata Institute of Fundamental Research, Colaba, Mumbai 400 005, India
Corresponding author: a ekkumar@tifr.res.in
Received:
30
March
2005
Revised:
8
June
2005
Published online:
2
August
2005
Low energy electron attachment to the fullerene molecule (C
and its
temperature dependence are studied in a crossed electron beam–molecular
beam experiment. We observe the strongest relative signal of C60 anion
near 0 eV electron energy with respect to higher energy resonant peaks
confirming the contribution of s-wave capture to the electron attachment
process and hence the absence of threshold behavior or activation barrier
near zero electron energy. While we find no temperature dependence for the
cross-section near zero energy, we observe a reduction in the cross-sections
at higher electron energies as the temperature is increased, indicating a
decrease in lifetime of the resonances at higher energies with increase in
temperature.
PACS: 34.80.Ht – Dissociation and dissociative attachment by electron impact / 34.80.Lx – Electron-ion recombination and electron attachment
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2005
