Low energy electron attachment to C60
Tata Institute of Fundamental Research, Colaba, Mumbai 400 005, India
Corresponding author: a email@example.com
Revised: 8 June 2005
Published online: 2 August 2005
Low energy electron attachment to the fullerene molecule (C and its temperature dependence are studied in a crossed electron beam–molecular beam experiment. We observe the strongest relative signal of C60 anion near 0 eV electron energy with respect to higher energy resonant peaks confirming the contribution of s-wave capture to the electron attachment process and hence the absence of threshold behavior or activation barrier near zero electron energy. While we find no temperature dependence for the cross-section near zero energy, we observe a reduction in the cross-sections at higher electron energies as the temperature is increased, indicating a decrease in lifetime of the resonances at higher energies with increase in temperature.
PACS: 34.80.Ht – Dissociation and dissociative attachment by electron impact / 34.80.Lx – Electron-ion recombination and electron attachment
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2005