https://doi.org/10.1140/epjd/e2003-00226-2
Electron-impact detachment from S-
1
Department of Physics, Chalmers University of Technology/Göteborg University, 412 96
Göteborg, Sweden
2
Department of Physics, AlbaNova, Stockholm University, 106 91 Stockholm,
Sweden
3
Physics Department, Queen's University Belfast, Belfast BT7 1NN, Northern Ireland, UK
4
Department of Physics, University of Tennessee, Knoxville, Tennessee 37996, USA
5
Manne Siegbahn
Laboratory, Frescativägen 24, 104 05 Stockholm, Sweden
Corresponding author: a f3aka@fy.chalmers.se
Received:
24
April
2003
Revised:
13
May
2003
Published online:
29
July
2003
Absolute cross sections for single and double electron-impact detachment of the S- ion have
been investigated over collision energy ranges of 0–60 eV and 0–30 eV, respectively. The experiment was
performed at the ion storage ring, CRYRING. The threshold energies were measured to be 6.6 eV for single
detachment and 19.8 eV in the case of double detachment. The single detachment cross section has a maximum
of 
cm2 at 30 eV. The double detachment cross section was studied only in the
threshold region. No sharp structures were observed in either of the cross sections.
PACS: 34.80.Dp – Atomic excitation and ionization by electron impact / 34.80.Kw – Electron-ion scattering; excitation and ionization
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2003
