Ultraviolet photoelectron spectroscopy of Si4− to Si−1000

M. Astruc Hoffmann; G. Wrigge; J. Müller; G. Ganteför; H. Haberland

doi:10.1007/s100530170048

EPJ

Ultraviolet photoelectron spectroscopy of Si₄⁻ to Si⁻₁₀₀₀

M. Astruc Hoffmann¹, G. Wrigge¹, B.v. Issendorff¹^a, J. Müller¹, G. Ganteför² and H. Haberland¹

¹ Fakultät für Physik, Universität Freiburg, H. Herderstr. 3, 79104 Freiburg, Germany
² Fachbereich Physik, Universität Konstanz, 78457 Konstanz, Germany

Received: 30 November 2000
Published online: 15 September 2001

Abstract

Using a new experimental setup we have measured UV (hν = 6.4 eV) photoelectron spectra of cold silicon cluster anions Si

in a very broad size range. For sizes up to n=46 the spectra exhibit rich structures. For larger sizes only smooth spectra have been obtained. No trace of a bandgap has been found even for clusters with more than 1000 atoms.

PACS: 36.40.Mr – Spectroscopy and geometrical structure of clusters / 33.60.Cv – Ultraviolet and vacuum ultraviolet photoelectron spectra / 71.24.+q – Electronic structure of clusters and nanoparticles