https://doi.org/10.1007/s100530070054
Structural characterisation of Ni clusters in AlN via X-ray absorption, X-ray diffraction and transmission electron microscopy
1
Laboratoire pour l'Utilisation du Rayonnement Électromagnétique (LURE), Bât. 209A, B.P. 34, 91898 Orsay Cedex, France
2
Laboratoire de Chimie Métallurgie (LCM), 15 rue G. Urbain, 94407 Vitry Cedex, France
3
Centre d'Élaboration de Matériaux et d'Études Structurales (CEMES), B.P. 4347, 31055 Toulouse Cedex 04, France
Received:
25
August
1999
Revised:
8
February
2000
Published online: 15 October 2000
Ni ions were implanted in bulk AlN with the goal to form embedded metallic clusters. Combining several characterisation techniques such as X-ray absorption spectroscopy, X-ray diffraction and high resolution transmission electron microscopy, we determined the lattice parameter of the Ni clusters that display a fcc crystalline structure. The average size increases when the ion fluence is increased or after a thermal treatment. Thanks to moiré fringes observed by high resolution transmission electron microscopy and to satellite peaks seen on the diffraction patterns, we concluded that the annealed Ni clusters orientate their (002) planes on the (101) of AlN. Moreover, the satellite positions allowed us to calculate Ni cluster average diameters, that are in agreement with average sizes deduced by X-ray absorption spectroscopy.
PACS: 61.46.+w – Clusters, nanoparticles, and nanocrystalline materials / 61.10.Ht – X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc. / 61.10.-i – X-ray diffraction and scattering
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2000
