Neutralization of specularly reflecting H+ ions on a clean (001) surface of SnTe
Department of Physics, Osaka Kyoiku University, Kashiwara, Osaka 582-8582, Japan
Published online: 15 August 1999
Neutral fractions of specularly reflected beams have been measured for the glancing-angle incidence of (0.2–0.5) MeV ions on a clean (001) surface of SnTe. The measured fractions have been compared with the results calculated by a classical model for charge exchanges and by a model based on the first-order perturbation theory. The experimental and calculated results have differed greatly. The disagreements are attributed to collisions with valence electrons on the surface. The electron capture cross-sections of (0.2–0.5) MeV ions for valence electrons have been derived, based on the measured neutral fraction and distribution of valence electrons for jellium background positive charges, and are found to be about ten times larger than those for the outermost electrons of Sn and Te atoms calculated by the classical model.
PACS: 79.20.Rf – Atomic, molecular, and ion beam impact and interactions with surfaces / 34.70.+e – Charge transfer / 34.50.Bw – Energy loss and stopping power
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 1999