https://doi.org/10.1140/epjd/e20020084
Intensity noise of injected Nd:YVO4 microchip lasers
Laboratoire Kastler Brossel, Université Pierre et Marie Curie,
École Normale Supérieure, CNRS,
4 place Jussieu, 75252 Paris Cedex 05, France
Corresponding author: a bramati@spectro.jussieu.fr
Received:
10
December
2001
Revised:
6
March
2002
Published online: 15 June 2002
The combined effects of the pump noise suppression and injection locking technique on the intensity noise of a diode pumped Nd:YVO4 microchip laser are theoretically and experimentally investigated. Complete cancellation of the relaxation oscillation peak is experimentally achieved. Very good agreement between experimental results and theoretical predictions of a fully quantum model describing lasers with injected signal is found.
PACS: 42.50.Dv – Nonclassical field states; squeezed, antibunched, and sub-Poissonian states; operational definitions of the phase of the field; phase measurements / 42.55.Xi – Diode-pumped lasers / 42.50.Lc – Quantum fluctuations, quantum noise, and quantum jumps
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2002
